| Characteristic |
Test conditions |
Performance |
| Thermal resistance Rth (¢J/W) |
Power: 5~26 W |
0.2~1.0 ¢J/W (depend on thermal management) |
| Life time test |
Power: 3W |
2000 hrs without any decay |
| High temperature test |
370 ¢J for 2 min. |
There was not any delaminating between diamond dielectric layer, conductive layer, soldering pad and substrate. |
| Thermal conductivity (W/mK) |
KINIK Test |
DLC dielectric: 475;
Total thermal conductivity of DLC PCB: same as Al substrate
|
| Adhesion (initial) |
0.33 cm2 pad, 5 mmƒÖ wire, Pulling speed: 25 mm/min., vertical pull |
>30 kgf/cm2 |
| Thermal cycle |
(+) 100 ¢J (30 min.)
to (5 min.)
(-)40 ¢J (30 min.) |
300 cycles |
| Thermal Sh¢Jk |
(+) 100 ¢J (30 min.)
to (10 sec)
(-)10 ¢J (30 min.) |
300 cycles |
| Low temperature life test |
Temperature: -40¢J
IF: 350 mA |
1000 hrs |
| The insulating test at high temperature |
180 ¢J
DC 500V |
1000 hrs |
| RoHS |
Test Report No.: CE/2008/30602 |
SGS Approved |